Théodore Simon

French psychiatrist (1873–1961)

Théodore Simon (French: [simɔ̃]; 10 July 1873 – 4 September 1961) was a French psychiatrist who worked with Alfred Binet to develop the Binet–Simon Intelligence Test, one of the most widely used scales in the world for measuring intelligence. This scale was revised in 1908 and 1911, and served as a template for the development of newer scales. Simon worked at various hospitals throughout France, including Sainte-Anne Hospital Center and Dury-les-Amiens.

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